Resonance-suppressed magnetic field probe for EM field-mapping system

被引：44

作者：

Kim, JM ^{[1
]}

Kim, WT ^{[1
]}

Yook, JG ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect & Elect Engn, Seoul 120749, South Korea

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2005年 / 53卷 / 09期

关键词：

electromagnetic (EM) field scanner; enhanced scanning range; passive detection; rectangular magnetic field probe; resonance suppressed wide-band probe;

D O I：

10.1109/TMTT.2005.854203

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel rectangular magnetic field probe is proposed, and calculated and measured results are presented. The proposed probe effectively suppresses the emission/reception of electromagnetic fields from the edge of the ground plane and, as a result, the usable frequency range of the probe is enhanced compared with that of the conventional one. In order to verify the performance of the probe, measured magnitude and phase of the magnetic field with an H-xy probe are presented from 1 to 7 GHz for two different geometries: microstrip line and bandpass filter for ultrawide-band application. The measurement results-agree very well with theoretically predicted field distributions, showing its excellent performances.

引用

页码：2693 / 2699

页数：7

共 11 条

[1] HIGH-SPEED CIRCUIT MEASUREMENTS USING PHOTOEMISSION SAMPLING [J].

BOKOR, J ;

JOHNSON, AM ;

STORZ, RH ;

SIMPSON, WM .

APPLIED PHYSICS LETTERS, 1986, 49 (04) :226-228

[2]

BUDKA TP, 1995, IEEE MTT-S, P1487, DOI 10.1109/MWSYM.1995.406255

[3] A new miniature magnetic field probe for measuring three-dimensional fields in planar high-frequency circuits [J].

Gao, YJ ;

Wolff, I .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1996, 44 (06) :911-918

[4] PROBING GUNN DOMAINS AT X-BAND MICROWAVE-FREQUENCIES USING A SCANNING MICROSCOPE [J].

HILL, MS ;

GOPINATH, A .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1974, 7 (01) :69-&

[5] Resonance suppressed magnetic probe for measuring electromagnetic field intensity [J].

Kim, JM ;

Song, WY ;

Yook, JG .

IEEE ANTENNAS AND PROPAGATION SOCIETY SYMPOSIUM, VOLS 1-4 2004, DIGEST, 2004, :499-502

[6]

KIM JM, 2004, AS PAC MICR C NEW DE

[7]

KIM WT, 2003, KOREA ELECTROMAGN EN, V26, P93

[8]

Osofsky S. S., 1989, IEEE 1989 MTT-S International Microwave Symposium Digest (Cat. No.89CH2725-0), P823, DOI 10.1109/MWSYM.1989.38849

[9] TRANSIT-TIME EFFECT IN ELECTRON-BEAM TESTING VOLTAGE MEASUREMENTS [J].

THONG, JTL .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1992, 3 (09) :827-837

[10] Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna [J].

Yang, K ;

David, G ;

Yook, JG ;

Papapolymerou, I ;

Katehi, LPB ;

Whitaker, JF .

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2000, 48 (02) :288-294

← 1 2 →