Enabling embedded memory diagnosis via test response compression

被引：13

作者：

Chen, JT ^{[1
]}

Rajski, J ^{[1
]}

Khare, J ^{[1
]}

Kebichi, O ^{[1
]}

Maly, W ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Dept ECE, Pittsburgh, PA 15213 USA

来源：

19TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 2001年

关键词：

BIST; diagnosis; RAM testing; bitmap; process monitoring; memory repair;

D O I：

10.1109/VTS.2001.923452

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

This paper introduces a method that enables failure diagnosis of BISTed memories by compression of rest responses. This method has been tested by simulation of memories with various specifications, fail patterns and rest algorithms. The proposed method has been implemented in 0.18 mu CMOS IC.

引用

页码：292 / 298

页数：7

共 8 条

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[8] [No title captured]

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