Effects of heavy ion radiation on digital micromirror device performance

被引:11
作者
Travinsky, Anton [1 ]
Vorobiev, Dmitry [1 ]
Ninkov, Zoran [1 ]
Raisanen, Alan D. [2 ]
Pellish, Jonny [3 ]
Robberto, Massimo [4 ]
Heap, Sara [3 ]
机构
[1] Rochester Inst Technol, Ctr Imaging Sci, 54 Lomb Mem Dr, Rochester, NY 14623 USA
[2] Rochester Inst Technol, Dept Mfg & Mech Engn Technol, 78 Lomb Mem Dr, Rochester, NY 14623 USA
[3] NASA, Goddard Space Flight Ctr, 8800 Greenbelt Rd, Greenbelt, MD 20771 USA
[4] Space Telescope Sci Inst, 3700 San Martin Dr, Baltimore, MD 21218 USA
基金
美国国家航空航天局;
关键词
digital micromirror device; digital micromirror array; multiobject spectrometer; multiple-object spectroscopy; heavy-ion radiation; MULTIOBJECT SPECTROGRAPH; SPECTROMETER; TELESCOPE;
D O I
10.1117/1.OE.55.9.094107
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
There is a pressing need in the astronomical community for space-suitable multiobject spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space-based mission. Therefore, the performance of DMDs under exoatmospheric radiation needs to be evaluated. DMDs were rewindowed with 2-mu m thick pellicle and tested under accelerated heavy-ion radiation (control electronics shielded from radiation), with a focus on the detection of single-event effects (SEEs) including latch-up events. Testing showed that while DMDs are sensitive to nondestructive ion-induced state changes, all SEEs are cleared with a soft reset (i.e., sending a pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays in orbit. (C) 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
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页数:8
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