Testing and testing techniques for real-time embedded software systems

被引：0
|
作者：
Tracey, N [1 ]
McDermid, J [1 ]
机构：
[1] Univ York, Dept Comp Sci, York YO10 5DD, N Yorkshire, England
来源：
MICROPROCESSORS AND MICROSYSTEMS | 2001年 / 24卷 / 09期
关键词：
D O I：
10.1016/S0141-9331(00)00096-X
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：441 / 441
页数：1
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