An increase of utilization efficiency of X-ray beam

被引：12

作者：

Lazurik, V. T. ^{[1
]}

Pismenesky, S. A. ^{[1
]}

Popov, G. F. ^{[1
]}

Rudychev, D. V. ^{[1
]}

Rudychev, V. G. ^{[1
]}

机构：

[1] Kharkov Natl Univ, Radiat Phys Lab, UA-61077 Kharkov, Ukraine

来源：

RADIATION PHYSICS AND CHEMISTRY | 2007年 / 76卷 / 11-12期

关键词：

x-ray beam; simulation methods; utilization efficiency;

D O I：

10.1016/j.radphyschem.2007.03.019

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The features of absorbed dose field formation in objects irradiated with scanned X-ray beams at double-and four-sided irradiation were investigated both analytically and by Monte Carlo methods. An analytical approach uses an angular/spectrum X-ray characteristics calculated with PENELOPE, JEANT 4 and ModeXR codes. It was shown that the special angular orientation of electron beam incidence on the X-ray converter leads to X-ray dose smoothing on the surface of the irradiated object. At the same time, a double-sided irradiation can provide high X-ray beam efficiency at dose uniformity ration (DUR) < 1.5 for sizeable object thickness. At four-sided irradiation, the angular orientation of electron beam incidence on the X-ray converter should be changed so as to focus the electrons to the center of the converter. At this mode X-ray beam efficiency is more than 60%. (C) 2007 Elsevier Ltd. All rights reserved.

引用

页码：1787 / 1791

页数：5

共 6 条

[1]

Kalinichenko AL, 2003, PROCEEDINGS OF THE 2003 PARTICLE ACCELERATOR CONFERENCE, VOLS 1-5, P1080

[2]

LAZURIK VT, 2005, P 11 INT C CHARG PAR, P328

[3] BEAM SCANNING FOR DOSE UNIFORMITY [J].

MCKEOWN, J ;

CRAIG, ST ;

DREWELL, NH ;

FRKETICH, G ;

SMYTH, DL .

RADIATION PHYSICS AND CHEMISTRY, 1995, 46 (4-6) :1363-1372

[4] X-ray treatment at 5 MeV and above [J].

Meissner, J ;

Abs, M ;

Cleland, MR ;

Herer, AS ;

Jongen, Y ;

Kuntz, F ;

Strasser, A .

RADIATION PHYSICS AND CHEMISTRY, 2000, 57 (3-6) :647-651

[5] The Palletron™:: a high-dose uniformity pallet irradiator with X-rays [J].

Stichelbaut, F ;

Bol, JL ;

Cleland, MR ;

Grégoire, O ;

Herer, AS ;

Jongen, Y ;

Mullier, B .

RADIATION PHYSICS AND CHEMISTRY, 2004, 71 (1-2) :291-295

[6]

Stichelbaut F, 2003, AIP CONF PROC, V680, P891

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