Technological cognitive diagnosis model for patent keyword analysis

被引:6
作者
Park, Sangsung [1 ]
Jun, Sunghae [1 ]
机构
[1] Cheongju Univ, Dept Big Data & Stat, Chungbuk, South Korea
来源
ICT EXPRESS | 2020年 / 6卷 / 01期
关键词
Patent analysis; Patent documents; Cognitive diagnosis model; Technological cognitive diagnosis model; Patent keyword analysis;
D O I
10.1016/j.icte.2019.09.004
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Patent analysis has been performed in various areas of technology management to understand technology such as research and development planning, new product development, technology innovation, sustainable technology etc. In the patent analysis, the analysis of patent keywords with technological information is very popular and meaningful. So we study on a method for patent keyword analysis, and use the cognitive diagnosis model (CDM) to construct the proposed method. We call our method technological cognitive diagnosis model (TCDM), this provides significant technology structure for understanding target technology using the result of patent keyword analysis by TCDM. We illustrate the performance of the TCDM by the experiments using the patent documents related to artificial intelligence (AI) technology. The final goal of these experiments is to find the relationship between core technologies for AI. (C) 2020 The Korean Institute of Communications and Information Sciences (KICS). Publishing services by Elsevier B.V.
引用
收藏
页码:57 / 61
页数:5
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