Electronic structures of Bi4-xLaxTi3O12 and Bi4ZrxTi3-xO12 single crystals studied by soft-X-ray spectroscopy

被引：10
作者：
Higuchi, T [1 ]
Moriuchi, Y
Noguchi, Y
Miyayama, M
Shin, S
Tsukamoto, T
机构：
[1] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan
[2] Univ Tokyo, Inst Ind Sci, Tokyo 1538505, Japan
[3] Univ Tokyo, Inst Solid State Phys, Chiba 2778581, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2003年 / 42卷 / 9B期
关键词：
Bi4-xLaxTi3O12; Bi4Ti3-xZrxO12; single crystal; electronic structure; soft-X-ray emission spectroscopy (SXES); X-ray absorption spectroscopy (XAS); Ti-O hybridization effect; lattice constant;
D O I：
10.1143/JJAP.42.6226
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The electronic structures of La-doped Bi4Ti3O12 (Bi4-xLaxTi3O12) and Zr-doped Bi4Ti3O12 (Bi4ZrxTi3-xO12) single crystals have been studied by X-ray absorption spectroscopy (XAS) and soft-X-ray emission spectroscopy (SXES). In both Bi4-xLaxTi3O12 and Bi4Ti3-xZrxO12, the Ti 3d and O 2p partial densities of states (PDOS) in the valence band region were observed in O 1s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of Bi4-xLaxTi3O12 increases with, increasing La dopant concentration, although that of Bi4Ti3-xZrxO12 does not depends on Zr dopant concentration. This finding indicates that the hybridization effect is closely related to the change in,the bond length between Ti and O ions.
引用
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页码：6226 / 6229
页数：4
相关论文
共 19 条
[1]   Fatigue-free behavior of highly oriented Bi3.25La0.75Ti3O12 thin films grown on Pt/Ti/SiO2/Si(100) by metalorganic solution decomposition [J].
Chon, U ;
Yi, GC ;
Jang, HM .
APPLIED PHYSICS LETTERS, 2001, 78 (05) :658-660
[2]   CRYSTAL SYMMETRY OPTICAL PROPERTIES AND FERROELECTRIC POLARIZATION OF BI4TI3O12 SINGLE CRYSTALS [J].
CUMMINS, SE ;
CROSS, LE .
APPLIED PHYSICS LETTERS, 1967, 10 (01) :14-&
[3]   Crystal-field splitting and the on-site Coulomb energy of LaxSr1-xTiO3 from resonant soft-x-ray emission spectroscopy [J].
Higuchi, T ;
Tsukamoto, T ;
Watanabe, M ;
Grush, MM ;
Callcott, TA ;
Perera, RC ;
Ederer, DL ;
Tokura, Y ;
Harada, Y ;
Tezuka, Y ;
Shin, S .
PHYSICAL REVIEW B, 1999, 60 (11) :7711-7714
[4]   Ti-O hybridization effect on ferroelectric phase transition of BaTiO3 [J].
Higuchi, T ;
Tsukamoto, T ;
Oka, K ;
Yokoya, T ;
Tezuka, Y ;
Shin, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1999, 38 (9B) :5667-5669
[5]   Direct evidence of p-type SrTiO3 by high-resolution x-ray absorption spectroscopy -: art. no. 033201 [J].
Higuchi, T ;
Tsukamoto, T ;
Kobayashi, K ;
Yamaguchi, S ;
Ishiwata, Y ;
Sata, N ;
Hiramoto, K ;
Ishigame, M ;
Shin, S .
PHYSICAL REVIEW B, 2002, 65 (03) :1-4
[6]   Electronic structures of Bi4Ti3O12 thin film and single crystal determined by resonant soft-x-ray emission spectroscopy [J].
Higuchi, T ;
Kudoh, K ;
Takeuchi, T ;
Masuda, Y ;
Harada, Y ;
Shin, S ;
Tsukamoto, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (11B) :7195-7197
[7]   Electronic structure of Bi4Ti3O12 thin film by soft-X-ray emission spectroscopy [J].
Higuchi, T ;
Tanaka, M ;
Kudoh, K ;
Takeuchi, T ;
Harada, Y ;
Shin, S ;
Tsukamoto, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (9B) :5803-5805
[8]   Electronic structure in the band gap of lightly doped SrTiO3 by high-resolution x-ray absorption spectroscopy [J].
Higuchi, T ;
Tsukamoto, T ;
Kobayashi, K ;
Ishiwata, Y ;
Fujisawa, M ;
Yokoya, T ;
Yamaguchi, S ;
Shin, S .
PHYSICAL REVIEW B, 2000, 61 (19) :12860-12863
[9]   Bi3.25La0.75Ti3O12 thin films prepared on Si (100) by metalorganic decomposition method [J].
Hou, Y ;
Xu, XH ;
Wang, H ;
Wang, M ;
Shang, SX .
APPLIED PHYSICS LETTERS, 2001, 78 (12) :1733-1735
[10]  
MORIUCHI Y, UNPUB
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