Combined Genetic Algorithm and Neural Network Technique for Transistor Modeling

被引:0
作者
Jarndal, Anwar [1 ]
机构
[1] Univ Sharjah, Elect & Comp Engn Dept, Sharjah 27272, U Arab Emirates
来源
2015 INTERNATIONAL CONFERENCE ON COMMUNICATIONS, SIGNAL PROCESSING, AND THEIR APPLICATIONS (ICCSPA'15) | 2015年
关键词
GaN HEMT; high power amplifier; large-signal modeling; neural networks; genetic optimization; RF;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A genetic algorithm neural network (GANN) technique for transistor modeling is presented. The proposed method is based on genetic optimization to extract the extrinsic elements of the equivalent circuit model; while the intrinsic part is modelled using a combined genetic neural network approach. The developed procedure has been applied to 1-mm gate width GaN high electron mobility transistor (HEMT) and validated by small- and large-signal measurements.
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页数:4
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