Mars radar clutter and surface roughness characteristics from MARSIS data

Radar sounder studies of icy, sedimentary, and volcanic settings can be affected by reflections from surface topography surrounding the sensor nadir location. These off-nadir "clutter" returns appear at similar time delays to subsurface echoes and complicate geologic interpretation. Additionally, broadening of the radar echo in delay by surface returns sets a limit on the detectability of subsurface interfaces. We use MARSIS 4MHz data to study variations in the nadir and off-nadir clutter echoes, from about 300 km to 1000 km altitude, R, for a wide range of surface roughness. This analysis uses a new method of characterizing ionospheric attenuation to merge observations over a range of solar zenith angle and date. Mirror-like reflections should scale as R-2, but the observed 4MHz nadir echoes often decline by a somewhat smaller power-law factor because MARSIS on-board processing increases the number of summed pulses with altitude. Prior predictions of the contributions from clutter suggest a steeper decline with R than the nadir echoes, but in very rough areas the ratio of off-nadir returns to nadir echoes shows instead an increase of about R-1/2 with altitude. This is likely due in part to an increase in backscatter from the surface as the radar incidence angle at some round-trip time delay declines with increasing R. It is possible that nadir and clutter echo properties in other planetary sounding observations, including RIME and REASON flyby data for Europa, will vary in the same way with altitude, but there may be differences in the nature and scale of target roughness (e.g., icy versus rocky surfaces). We present global maps of the ionosphere- and altitude-corrected nadir echo strength, and of a "clutter" parameter based on the ratio of off-nadir to nadir echoes. The clutter map offers a view of surface roughness at similar to 75m length scale, bridging the spatial-scale gap between SHARAD roughness estimates and MOLA-derived parameters. Published by Elsevier Inc.