High transmittance n-type tin-oxysulfide Sn(OxS2-x) heterojunction layer grown from surfactant mediated chemical bath deposition for thin film solar cells

Highly transparent n-type polycrystalline SnS2 and Sn(OxS2-x) thin films were deposited by a modified chemical bath deposition technique using an ionic surfactant t-Octylphenoxy polyethoxy ethanol (abbreviated Tx) activator. X-ray photoelectron spectra (XPS) analysis of the films shows the presence of Sn3d(5/2) (486.65 eV) and S2p(3/2) (161.7 eV) XPS lines signifying the Sn4+-S2- bonding confirming single phase SnS2 film formation with the addition of < 5 v/v% Tx. With the addition of Tx in higher >= 5 v/v% Tx concentration, a strong O1s (531.1 eV) XPS peak attributed to the lattice oxygen matched with the asymmetrical Sn3d(5/2) (486.65 and 487.31 eV) XPS peaks confirm the growth of Sn-oxysulfide [Sn(OxS2-x)] film. The Raman spectral analysis based on single intense 314 cm(-1) peak suggests the monophasic SnS2 film growth is promoted by Tx addition and complete suppression of the SnS and Sn2S3 phases. Grazing incidence X-ray diffraction show formation of highly crystalline SnS2 film in the hexagonal phase with preferred [100] orientation. Scanning electron micrograph images show uniform lateral growth apparently aided by homogeneous substrate surface nucleation for films deposited with Tx added in the chemiplating solution. The mechanism of SnS2 and Sn(OxS2-x) film growth is discussed in detail based on the reactions which involve controlled dissociation Sn(OH)(4) into SnO alongside the SnS2 formation. The photoluminescence (PL) spectrum of deposited films showed a dominant PL peak at similar to 492 nm attributed to the direct excitonic transitions. The optical transmittance spectra of the Sn(OxS2-x) films are suggestive of subbandgap absorption region characterized by gradually decreasing mid-gap states from 2.60 to 2.49 eV and gradually increasing direct bandgap from 3.16 to 3.34 eV indicating increase in oxygen incorporation with increasing concentration of Tx in chemiplating solution. The high optical bandgap and low absorption coefficient 3.2 - 5.8 x 10(3) cm(-1) in the 900-400 nm range of the Sn(OxS2-x) films is highly suitable for application as an ntype heterojunction layer in thin film solar cells.