Diffusion of Si adatoms on H-terminated Si(001) surfaces
被引:0
作者:
Ohno, T
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机构:
Natl Res Inst Met, Tsukuba, Ibaraki 305, JapanNatl Res Inst Met, Tsukuba, Ibaraki 305, Japan
Ohno, T
[1
]
Nara, J
论文数: 0引用数: 0
h-index: 0
机构:
Natl Res Inst Met, Tsukuba, Ibaraki 305, JapanNatl Res Inst Met, Tsukuba, Ibaraki 305, Japan
Nara, J
[1
]
Sasaki, T
论文数: 0引用数: 0
h-index: 0
机构:
Natl Res Inst Met, Tsukuba, Ibaraki 305, JapanNatl Res Inst Met, Tsukuba, Ibaraki 305, Japan
Sasaki, T
[1
]
机构:
[1] Natl Res Inst Met, Tsukuba, Ibaraki 305, Japan
来源:
MICROSCOPIC SIMULATION OF INTERFACIAL PHENOMENA IN SOLIDS AND LIQUIDS
|
1998年
/
492卷
关键词:
D O I:
暂无
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
We have investigated adsorption and diffusion processes of a Si atom on hydrogen-terminated Si(001)-(2x1) surfaces using first-principles total-energy calculations. The Si adatom segregates H atoms from surface Si dimer atoms on the monohydride terminated Si(001) surface. The migration of the Si adatom is assisted by the mobility of H atoms, that is, the Si adatom migrates on the surface by repeating release and capture of H atoms. The effects of a single H-terminated Si dimer on the Si migration are also examined. Calculated results are in good agreements with the variation in morphology of Si homoepitaxial films induced by hydrogen termination.