Bent-beam electro-thermal actuators for high force applications

被引:119
作者
Que, L [1 ]
Park, JS [1 ]
Gianchandani, YB [1 ]
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA
来源
MEMS '99: TWELFTH IEEE INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, TECHNICAL DIGEST | 1999年
关键词
D O I
10.1109/MEMSYS.1999.746747
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes in-plane microactuators fabricated by standard microsensor materials and processes that can generate forces upto about a milli-newton. They operate by leveraging the deformations produce by localized thermal stresses. Analytical and finite element models of device performance are presented along with measured results of fabricated devices using electroplated Ni, LPCVD polysilicon, and p(++) Si as structural materials. A maskless process extension for incorporating thermal and electrical isolation is outlined. Test results show that static displacements of approximate to 10 mu m can be achieved with power dissipation of approximate to 100 mW, and output forces >300 CIN can be achieved with input power <250 mW. It is also shown that cascaded devices offer a 4X improvement in displacement. The displacements are rectilinear, and the output forces generated are 10X-100X higher than those available from other comparable options. This performance is achieved at much lower drive voltages than necessary for electrostatic actuation, indicating that bent-beam thermal actuators are suitable for integration in a variety of microsystems.
引用
收藏
页码:31 / 36
页数:6
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