Asymmetric properties of Pb(Zr,Ti)O3 thin film capacitors with conducting oxides

被引:3
作者
Choi, CH [1 ]
Lee, J [1 ]
机构
[1] Sungkyunkwan Univ, Dept Mat Engn, Suwon 440746, South Korea
来源
JOURNAL DE PHYSIQUE IV | 1998年 / 8卷 / P9期
关键词
D O I
10.1051/jp4:1998918
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Asymmetric properties of Pb(Zr,Ti)O-3 (PZT) thin films has been studied in (La,Sr)CoO3/Pb(Zr,Ti)O-3/(La,Sr)CoO3 (LSCO) heterostructures in which the conducting oxide (La,Sr)CoO3 (LSCO) and/or LaCoO3 (LCO) have been used as an electrode. LCO/PZT/LSCO showed a largely asymmetric P-V hysteresis loop and large relaxation of the remanent polarization at the negatively poled state, eventually leading to an imprint failure. Corresponding to P-V hysteresis loop, leakage current behavior and capacitance - voltage characteristic of the LCO/PZT/LSCO were asymmetric. Post annealing treatment at reducing atmosphere further increased the relaxation of the unstable remanenet polarization.
引用
收藏
页码:109 / 112
页数:4
相关论文
共 12 条
[1]   PHOTOINDUCED HYSTERESIS CHANGES AND OPTICAL STORAGE IN (PB,LA)(ZR,TI)O3 THIN-FILMS AND CERAMICS [J].
DIMOS, D ;
WARREN, WL ;
SINCLAIR, MB ;
TUTTLE, BA ;
SCHWARTZ, RW .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (07) :4305-4315
[2]   Ferroelectric field effect in (La,Sr)CoO3/Pb(Zr,Ti)O-3/(La,Sr)CoO3 heterostructures [J].
Kim, SW ;
Lee, JC .
INTEGRATED FERROELECTRICS, 1997, 18 (1-4) :405-414
[3]   Built-in voltages and asymmetric polarization switching in Pb(Zr,Ti)O3 thin film capacitors [J].
Lee, J ;
Choi, CH ;
Park, BH ;
Noh, TW ;
Lee, JK .
APPLIED PHYSICS LETTERS, 1998, 72 (25) :3380-3382
[4]   IMPRINT AND OXYGEN DEFICIENCY IN (PB,LA)(ZR,TI)O-3 THIN-FILM CAPACITORS WITH LA-SR-CO-O ELECTRODES [J].
LEE, J ;
RAMESH, R ;
KERAMIDAS, VG ;
WARREN, WL ;
PIKE, GE ;
EVANS, JT .
APPLIED PHYSICS LETTERS, 1995, 66 (11) :1337-1339
[5]   EFFECTS OF CRYSTALLINE QUALITY AND ELECTRODE MATERIAL ON FATIGUE IN PB(ZR, TI)O3 THIN-FILM CAPACITORS [J].
LEE, J ;
JOHNSON, L ;
SAFARI, A ;
RAMESH, R ;
SANDS, T ;
GILCHRIST, H ;
KERAMIDAS, VG .
APPLIED PHYSICS LETTERS, 1993, 63 (01) :27-29
[6]   RETENTION AND IMPRINT PROPERTIES OF FERROELECTRIC THIN-FILMS [J].
LEE, JJ ;
THIO, CL ;
DESU, SB .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 151 (01) :171-182
[7]   EVALUATION OF IMPRINT PROPERTIES IN SOL-GEL FERROELECTRIC PB(ZRTI)O3 THIN-FILM CAPACITORS [J].
MIHARA, T ;
WATANABE, H ;
DEARAUJO, CAP .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (9B) :4168-4174
[8]   Effects of interface charges on imprint of epitaxial Bi4Ti3O12 thin films [J].
Park, BH ;
Noh, TW ;
Lee, J ;
Kim, CY ;
Jo, W .
APPLIED PHYSICS LETTERS, 1997, 70 (09) :1101-1103
[9]   VOLTAGE OFFSETS IN (PB,LA)(ZR,TI)O-3 THIN-FILMS [J].
PIKE, GE ;
WARREN, WL ;
DIMOS, D ;
TUTTLE, BA ;
RAMESH, R ;
LEE, J ;
KERAMIDAS, VG ;
EVANS, JT .
APPLIED PHYSICS LETTERS, 1995, 66 (04) :484-486
[10]   FERROELECTRIC MEMORIES [J].
SCOTT, JF ;
DEARAUJO, CAP .
SCIENCE, 1989, 246 (4936) :1400-1405