Uncertainty analysis for the NIST 0:45 reflectometer

被引:5
作者
Early, Edward A. [2 ]
Nadal, Maria E. [1 ]
机构
[1] Natl Inst Stand & Technol, Opt Technol Div, Gaithersburg, MD 20899 USA
[2] AFRL HEDO, Brooks City Base, TX 78235 USA
关键词
uncertainty; color standards; colorimetry;
D O I
10.1002/col.20388
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Sets of color tiles are available from the National Institute of Standards and Technology calibrated using the NIST 0:45 Reflectometer. The uncertainties associated with the measured values for the color tiles are an indispensable component of the calibration report that accompanies these tiles. A systematic, analytical approach developed previously was applied to the particular case of the reference instrument and color tile set, taking into account the operation and characteristics of the instrument and the spectral properties of the set. The primary sources of uncertainty were identified, and the resulting un certain ties in the color space values L*, a*, and b* were determined. In general, the uncertainties are lowest for those color tiles whose reflectance factors are nearly constant with wavelength. Published in 2008 by John Wiley & Sons, Inc.
引用
收藏
页码:100 / 107
页数:8
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