Observation of Meyer-Neldel rule in CdS thin films

被引：9

作者：

Hariech, S. ^{[1
]}

Aida, M. S. ^{[1
,2
]}

Moualkia, H. ^{[1
,3
]}

机构：

[1] Univ Constantine, Fac Sci, Lab Couches Minces & Interfaces, Constantine, Algeria

[2] Taibah Univ, Dept Phys, Fac Sci, Madinah, Saudi Arabia

[3] Univ Oum el Bouaghi, Fac Sci, Oum El Bouaghi, Algeria

来源：

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 2012年 / 15卷 / 02期

关键词：

II-VI semiconductors; Meyer-Neldel rule; Polaron; Chemical bath; OPTICAL-PROPERTIES; ELECTRON-TRANSFER; CONDUCTIVITY; TRANSPORT; APPLICABILITY; CONNECTION; DIFFUSION;

D O I：

10.1016/j.mssp.2011.10.008

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A study of electrical transport in CdS thin films is reported. We have observed, for the first time, that CdS thin film conductivity obeys the Meyer-Neldel rule (MNR). This was deduced from linking the conductivity pre-exponential factor to the activation energy variation. CdS films were deposited by chemical bath deposition at different solution temperatures in order to vary the electrical activation energy of the films. A correlation between the MNR rule and the disorder in the film network is highlighted. The multi-trapping process in the band tail-localized states governs the conductivity in CdS films. This explains the MNR observation in CdS films. The variation of the electrical conductivity pre-exponential factor and activation energy are correlated to the disorder in the film network; this was explained in terms of polaron formation and phonon-electron coupling with disorder. (c) 2011 Elsevier Ltd. All rights reserved.

引用

页码：181 / 186

页数：6

共 51 条

[1] Abdel-Wahab F., 2004, Turkish Journal of Physics, V28, P133
[2] Signature of the Meyer-Neldel rule on the correlated barrier-hopping model
Abdel-Wahab, F
[J]. JOURNAL OF APPLIED PHYSICS, 2002, 91 (01) : 265 - 270
[3] Electrical conductivity and Meyer-Neldel rule: The role of localized states in hydrogenated amorphous silicon
Abtew, T. A.
Zhang, MingLiang
Pan, Yue
Drabold, D. A.
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (19-25) : 2909 - 2913
[4] Ab initio estimate of temperature dependence of electrical conductivity in a model amorphous material:: Hydrogenated amorphous silicon
Abtew, T. A.
Zhang, Mingliang
Drabold, D. A.
[J]. PHYSICAL REVIEW B, 2007, 76 (04)
[5] ANDERSON DA, 1982, PHILOS MAG B, V45, P1, DOI 10.1080/01418618208243899
[6] ELECTRICAL-CONDUCTION IN CHALCOGENIDE GLASSES - APPLICABILITY OF THE MEYER-NELDEL RULE
ARORA, R
KUMAR, A
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1991, 125 (01): : 273 - 278
[7] Cardall RS., 1991, PHYS REV B, V43, P4059
[8] CONNECTION BETWEEN THE MEYER-NELDEL RULE AND STRETCHED-EXPONENTIAL RELAXATION
CHEN, YF
HUANG, SF
[J]. PHYSICAL REVIEW B, 1991, 44 (24): : 13775 - 13778
[9] MEYER-NELDEL RULE IN SOLAR-CELLS
COUTTS, TJ
PEARSALL, NM
[J]. APPLIED PHYSICS LETTERS, 1984, 44 (01) : 134 - 135
[10] DEFECT RELAXATION IN AMORPHOUS-SILICON - STRETCHED EXPONENTIALS, THE MEYER-NELDEL RULE, AND THE STAEBLER-WRONSKI EFFECT
CRANDALL, RS
[J]. PHYSICAL REVIEW B, 1991, 43 (05): : 4057 - 4070

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