Interface modification effect between p-type a-SiC:H and ZnO:Al in p-i-n amorphous silicon solar cells

被引:21
作者
Baek, Seungsin [1 ]
Lee, Jeong Chul [2 ]
Lee, Youn-Jung [1 ]
Iftiquar, Sk Md [1 ]
Kim, Youngkuk [1 ]
Park, Jinjoo [1 ]
Yi, Junsin [1 ]
机构
[1] Sungkyunkwan Univ, Sch Informat & Commun Engn, Suwon 440746, South Korea
[2] Korea Inst Energy Res, Photovolta Res Ctr, Taejon 305343, South Korea
来源
NANOSCALE RESEARCH LETTERS | 2012年 / 7卷
基金
新加坡国家研究基金会;
关键词
buffer layer; amorphous materials; thin films; plasma deposition; electrical properties;
D O I
10.1186/1556-276X-7-81
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Aluminum-doped zinc oxide (ZnO:Al) [AZO] is a good candidate to be used as a transparent conducting oxide [TCO]. For solar cells having a hydrogenated amorphous silicon carbide [a-SiC:H] or hydrogenated amorphous silicon [a-Si:H] window layer, the use of the AZO as TCO results in a deterioration of fill factor [FF], so fluorine-doped tin oxide (Sn0(2):F) [FTO] is usually preferred as a TCO. In this study, interface engineering is carried out at the AZO and p-type a-SiC:H interface to obtain a better solar cell performance without loss in the FF. The abrupt potential barrier at the interface of AZO and p-type a-SiC:H is made gradual by inserting a buffer layer. A few-nanometer-thick nanocrystalline silicon buffer layer between the AZO and a-SiC:H enhances the FF from 67% to 73% and the efficiency from 7.30% to 8.18%. Further improvements in the solar cell performance are expected through optimization of cell structures and doping levels.
引用
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页数:5
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