Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces

被引：38

作者：

Demir, MA

Johnson, JT

机构：

[1] Ohio State Univ, Dept Elect Engn, Dreese Labs 205, Columbus, OH 43210 USA

[2] Ohio State Univ, Dreese Lab 205, Electrosci Lab, Columbus, OH 43210 USA

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2003年 / 20卷 / 12期

关键词：

D O I：

10.1364/JOSAA.20.002330

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections. (C) 2003 Optical Society of America.

引用

页码：2330 / 2337

页数：8

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