The dynamic speckle-based wavemeter

被引:4
作者
Hanson, Steen G. [1 ]
Jakobsen, Michael Linde [1 ]
Chakrabarti, Maumita [2 ]
机构
[1] Tech Univ Denmark, Dept Photon Engn, Odense, Denmark
[2] DenseLight Semicond Pte Ltd, Singapore, Singapore
来源
SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY | 2018年 / 10834卷
关键词
Spectrometry; speckle; scattering; SPECTROMETER; DIFFRACTION;
D O I
10.1117/12.2319873
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Based on a previously devised speckle-based set-up for probing minute wavelength changes for a coherent field [1], [2] we will here present the first experiments where these changes are resolved on a millisecond time scale. The setup is based on probing the lateral shift of a speckle pattern arising from a slanted rough object, the speckle displacement being linearly proportional to the wavenumber change. Thus, by shearing the speckle pattern across a grating-like structure [3],[4] and [5], a frequency proportional to the frequency of the wavelength change can be derived as will the irradiance. Thus, a cordial display of the complex field amplitude may be obtained with a high temporal resolution and a reasonable spectral resolution. The spatial filter is here preliminarily implemented by recording the speckle pattern with a CMOS array with subsequent digital image processing mimicking the use of a spatial filter.
引用
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页数:6
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