SCANNING PROBE MICROSCOPY Taking a closer look at conductivity

被引：3

作者：

Macpherson, Julie V. ^{[1
]}

机构：

[1] Univ Warwick, Dept Chem, Coventry CV4 7AL, W Midlands, England

来源：

NATURE NANOTECHNOLOGY | 2011年 / 6卷 / 02期

关键词：

D O I：

10.1038/nnano.2011.8

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The formation of an atomic-scale metal filament at the end of an atomic force microscope will pave the way for higher-resolution imaging by AFMs with functionalized tips.

引用

页码：84 / 85

页数：3

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