Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation

被引：28

作者：

Cattaneo, S ^{[1
]}

Kauranen, M ^{[1
]}

机构：

[1] Tampere Univ Technol, Inst Phys, Opt Lab, FIN-33101 Tampere, Finland

来源：

OPTICS LETTERS | 2003年 / 28卷 / 16期

关键词：

D O I：

10.1364/OL.28.001445

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included. (C) 2003 Optical Society of America.

引用

页码：1445 / 1447

页数：3

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