Temporal contrast in Ti:Sapphire lasers:: Characterization and control

被引：71
作者：
Nantel, M
Itatani, J
Tien, AC
Faure, J
Kaplan, D
Bouvier, M
Buma, T
Van Rompay, P
Nees, J
Pronko, PP
Umstadter, D
Mourou, GA
机构：
[1] Univ Michigan, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA
[2] Univ Tokyo, Inst Solid State Phys, Minato Ku, Tokyo 106, Japan
[3] Alliage Inc, F-75005 Paris, France
[4] Medox Electroopt Inc, Ann Arbor, MI 48108 USA
来源：
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 1998年 / 4卷 / 02期
基金：
美国国家科学基金会;
关键词：
amplified spontaneous emission; chirped-pulse amplification; intensity contrast ratio; pulse cleaning; terawatt lasers;
D O I：
10.1109/2944.686755
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
As ultrafast lasers achieve ever higher focused intensities on target, the problem of ensuring a clean laser-solid interaction becomes more pressing. In this paper, we give concrete examples of the deleterious effects of low-contrast interactions, and address the problem of subpicosecond laser intensity contrast ratio on both characterization and control fronts, We present the new technique of high-dynamic-range plasma-shuttered streak camera contrast measurement, as well as two efficient and relatively inexpensive ways of improving the contrast of short pulse lasers without sacrificing on the output energy: a double-pass Pockels cell (PC), and clean high-energy-pulse seeding of the regenerative amplifier.
引用
收藏
页码：449 / 458
页数：10
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