Ferroelectric thin films for optical applications

被引：0

作者：

Buchal, C ^{[1
]}

Siegert, M ^{[1
]}

机构：

[1] Forschungszentrum Julich, Inst Schicht & Ionentech, ISI,IT, D-52425 Julich, Germany

来源：

INTEGRATED FERROELECTRICS | 2001年 / 35卷 / 1-4期

关键词：

thin films; optical ferroelectrics; integrated devices;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Presently the installation of optical fibers for high bandwidth communication services experiences an explosive growth on a world wide scale. As a consequence, a growing demand for more complex integrated optical devices is forseeable. At present, the technology for electrooptic integrated devices and components has been mostly satisfied by bulk LiNbO3, which is by far the most important optical ferroelectric. We will review the state of the art of "near-surface-modified"-ferroelectric devices, which have been patterned on bulk substrates and their potential counterparts to be fabricated completely in thin film technology on different substrates. Special emphasis will be laid upon theepitaxy of LiNbO3, BaTiO3 and (Pb, La) (Zr, Ti)O-3.

引用

页码：1731 / 1740

页数：10

共 45 条

[1]

[Anonymous], 1985, OPTICAL INTEGRATED C

[2]

BAUER S, 1994, MATER RES SOC SYMP P, V341, P283, DOI 10.1557/PROC-341-283

[3]

BAUER S, 1995, 3056 RES CTR

[4] Structural and optical characterization of epitaxial waveguiding BaTiO3 thin films on MgO [J].

Beckers, L ;

Schubert, J ;

Zander, W ;

Ziesmann, J ;

Eckau, A ;

Leinenbach, P ;

Buchal, C .

JOURNAL OF APPLIED PHYSICS, 1998, 83 (06) :3305-3310

[5]

BIHARI B, J APPL PHYS, V76, P1169

[6] Electro-optic characterization of (Pb, La)TiO3 thin films using prism-coupling technique [J].

Boudrioua, A ;

Loulergue, JC ;

Dogheche, E ;

Remiens, D .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (03) :1780-1783

[7]

BUCHAL C, 1994, ANNU REV MATER SCI, V24, P125

[8] Epitaxial BaTiO3 thin films on MgO [J].

Buchal, C ;

Beckers, L ;

Eckau, A ;

Schubert, J ;

Zander, W .

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1998, 56 (2-3) :234-238

[9] Ion implantation of optical ferroelectrics [J].

Buchal, C ;

Fluck, D ;

Günter, P .

JOURNAL OF ELECTROCERAMICS, 1999, 3 (02) :179-193

[10]

Clem PG, 1995, MATER RES SOC SYMP P, V392, P201, DOI 10.1557/PROC-392-201

← 1 2 3 4 5 →