Architecture of a silicon strip beam position monitor

被引：1

作者：

Angstadt, R. ^{[1
]}

Cooper, W. ^{[1
]}

Demarteau, M. ^{[1
]}

Green, J. ^{[1
]}

Jakubowski, S. ^{[1
]}

Prosser, A. ^{[1
]}

Rivera, R. ^{[1
]}

Turqueti, M. ^{[1
]}

Utes, M. ^{[1
]}

Cai, X. ^{[2
]}

机构：

[1] Fermilab Natl Accelerator Lab, Batavia, IL USA

[2] Inst High Energy Phys, Beijing 100039, Peoples R China

来源：

JOURNAL OF INSTRUMENTATION | 2010年 / 5卷

关键词：

Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors); Analogue electronic circuits; Data acquisition circuits; Front-end electronics for detector readout;

D O I：

10.1088/1748-0221/5/12/C12039

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A collaboration between Fermilab and the Institute for High Energy Physics (IHEP), Beijing, has developed a beam position monitor for the IHEP test beam facility. This telescope is based on 5 stations of silicon strip detectors having a pitch of 60 microns. The total active area of each layer of the detector is about 12x10 cm(2). Readout of the strips is provided through the use of VA1' ASICs mounted on custom hybrid printed circuit boards and interfaced to Adapter Cards via copper-over-kapton flexible circuits. The Adapter Cards amplify and level-shift the signal for input to the Fermilab CAPTAN data acquisition nodes for data readout and channel configuration. These nodes deliver readout of triggered events and temperature data to an analysis computer over gigabit Ethernet links.

引用

页数：8

共 4 条

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2010, 622 (01) :298-310

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SPECIFICATIONS VERSI

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