Plan-view transmission electron microscopy of crack tips in bulk materials

被引:0
作者
Saka, H [1 ]
Nagaya, G [1 ]
Sakuishi, T [1 ]
Abe, S [1 ]
Muroga, A [1 ]
机构
[1] NAGOYA UNIV,DEPT QUANTUM ENGN,NAGOYA,AICHI 46401,JAPAN
来源
FRACTURE-INSTABILITY DYNAMICS, SCALING, AND DUCTILE/BRITTLE BEHAVIOR | 1996年 / 409卷
关键词
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:45 / 50
页数:6
相关论文
共 50 条
[41]   Transmission electron microscopy of microstructures in ceramic materials [J].
Kleebe, HJ ;
Braue, W ;
Schmidt, H ;
Pezzotti, G ;
Ziegler, G .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 1996, 16 (03) :339-351
[42]   Cryogenic transmission electron microscopy for materials research [J].
McComb, David W. ;
Lengyel, Jeffrey ;
Carter, C. Barry .
MRS BULLETIN, 2019, 44 (12) :924-928
[43]   TRANSMISSION ELECTRON-MICROSCOPY OF METASTABLE MATERIALS [J].
HULTMAN, L .
NONEQUILIBRIUM MATERIALS, 1995, 103 :181-192
[44]   Back-etch method for plan view transmission electron microscopy sample preparation of optically opaque films [J].
Yao, Bo ;
Coffey, Kevin R. .
JOURNAL OF ELECTRON MICROSCOPY, 2008, 57 (02) :47-52
[45]   Plan-View Operando Video Microscopy of Li Metal Anodes: Identifying the Coupled Relationships among Nucleation, Morphology, and Reversibility [J].
Sanchez, Adrian J. ;
Kazyak, Eric ;
Chen, Yuxin ;
Chen, Kuan-Hung ;
Pattison, Ethan R. ;
Dasgupta, Neil P. .
ACS ENERGY LETTERS, 2020, 5 (03) :994-1004
[46]   Electron diffraction based techniques in scanning electron microscopy of bulk materials [J].
Wilkinson, AJ ;
Hirsch, PB .
MICRON, 1997, 28 (04) :279-308
[47]   A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers [J].
Prikhodko, A. S. ;
Zallo, E. ;
Calarco, R. ;
Borgardt, N. I. .
ULTRAMICROSCOPY, 2024, 267
[48]   Nanoanalytical investigations of functional materials by transmission electron microscopy [J].
Wetzig, Klaus ;
Thomas, Jürgen .
2001, Walter de Gruyter GmbH (38)
[49]   ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY OF MATERIALS IN JAPAN [J].
BANDO, Y .
JOURNAL OF ELECTRON MICROSCOPY, 1989, 38 :S81-S89
[50]   Transmission electron microscopy, spectroscopy and holography of nanostructured materials [J].
Dravid, VP .
ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, :135-136