Plan-view transmission electron microscopy of crack tips in bulk materials

被引：0

作者：

Saka, H ^{[1
]}

Nagaya, G ^{[1
]}

Sakuishi, T ^{[1
]}

Abe, S ^{[1
]}

Muroga, A ^{[1
]}

机构：

[1] NAGOYA UNIV,DEPT QUANTUM ENGN,NAGOYA,AICHI 46401,JAPAN

来源：

FRACTURE-INSTABILITY DYNAMICS, SCALING, AND DUCTILE/BRITTLE BEHAVIOR | 1996年 / 409卷

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：45 / 50

页数：6

共 50 条

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[27] PLAN-VIEW TRANSMISSION ELECTRON-DIFFRACTION MEASUREMENT OF ROUGHNESS AT BURIED SI/SIO2 INTERFACES [J].

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[29] Investigation of initial growth and very thin (11(2)over-bar0) ZnO films by cross-sectional and plan-view transmission electron microscopy [J].

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