Plan-view transmission electron microscopy of crack tips in bulk materials

被引:0
作者
Saka, H [1 ]
Nagaya, G [1 ]
Sakuishi, T [1 ]
Abe, S [1 ]
Muroga, A [1 ]
机构
[1] NAGOYA UNIV,DEPT QUANTUM ENGN,NAGOYA,AICHI 46401,JAPAN
来源
FRACTURE-INSTABILITY DYNAMICS, SCALING, AND DUCTILE/BRITTLE BEHAVIOR | 1996年 / 409卷
关键词
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:45 / 50
页数:6
相关论文
共 50 条
  • [21] Parallel preparation of plan-view transmission electron microscopy specimens by vapor-phase etching with integrated etch stops
    English, Timothy S.
    Provine, J.
    Marshall, Ann F.
    Koh, Ai Leen
    Kenny, Thomas W.
    ULTRAMICROSCOPY, 2016, 166 : 39 - 47
  • [22] A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples
    Yao, Bo
    Petrova, Rumyana V.
    Vanfleet, Richard R.
    Coffey, Kevin R.
    JOURNAL OF ELECTRON MICROSCOPY, 2006, 55 (04): : 209 - 214
  • [23] Sequential plan-view imaging of sub-surface structures in the transmission electron microscope
    Massabuau, F. C-P.
    Springbett, H. P.
    Divitini, G.
    Griffin, P. H.
    Zhu, T.
    Oliver, R. A.
    MATERIALIA, 2020, 12
  • [24] Sample preparation of InGaAsP/InP-based lasers for plan-view transmission electron microscopy using selective chemical thinning
    Kallstenius, T
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1999, 146 (02) : 758 - 760
  • [25] A Method for Directly Correlating Site-Specific Cross-Sectional and Plan-View Transmission Electron Microscopy of Individual Nanostructures
    Schreiber, Daniel K.
    Adusumilli, Praneet
    Hemesath, Eric R.
    Seidman, David N.
    Petford-Long, Amanda K.
    Lauhon, Lincoln J.
    MICROSCOPY AND MICROANALYSIS, 2012, 18 (06) : 1410 - 1418
  • [26] FINITE-ELEMENT ANALYSIS OF STRESS-RELAXATION IN THIN FOIL PLAN-VIEW TRANSMISSION ELECTRON-MICROSCOPY SPECIMENS
    HULL, R
    APPLIED PHYSICS LETTERS, 1993, 63 (16) : 2291 - 2293
  • [27] PLAN-VIEW TRANSMISSION ELECTRON-DIFFRACTION MEASUREMENT OF ROUGHNESS AT BURIED SI/SIO2 INTERFACES
    GIBSON, JM
    LANZEROTTI, MY
    ELSER, V
    APPLIED PHYSICS LETTERS, 1989, 55 (14) : 1394 - 1396
  • [28] STRAIN CONTRAST AT CRACK TIPS FOR INSITU TRANSMISSION ELECTRON-MICROSCOPY STRAINING EXPERIMENTS
    DEGRAEF, M
    CLARKE, DR
    ULTRAMICROSCOPY, 1993, 49 (1-4) : 354 - 365
  • [29] Investigation of initial growth and very thin (11(2)over-bar0) ZnO films by cross-sectional and plan-view transmission electron microscopy
    Lee, Jae Wook
    Han, Seok Kyu
    Hong, Soon-Ku
    Lee, Jeong Yong
    APPLIED SURFACE SCIENCE, 2010, 256 (06) : 1849 - 1854
  • [30] Electronically enhanced kink motion on 30° partial dislocations in Ge directly observed by plan-view high resolution electron microscopy
    Inoue, M
    Suzuki, K
    Amasuga, H
    Mera, Y
    Maeda, K
    JOURNAL OF APPLIED PHYSICS, 1998, 83 (04) : 1953 - 1957