Durability studies of metal evaporated tapes in a linear tape drive: Role of head contour and tape tension

被引：4

作者：

Goldade, AV ^{[1
]}

Bhushan, B ^{[1
]}

机构：

[1] Ohio State Univ, Nanotribol Lab Informat Storage & MEMS NEMS, Dept Mech Engn, Columbus, OH 43210 USA

来源：

MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2005年 / 11卷 / 01期

关键词：

metal evaporated tape; wear; durability; head contour; edge quality; linear tape drive;

D O I：

10.1007/s00542-004-0461-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Magnetic performance of metal evaporated (ME) tape makes it a prominent storage media candidate for future data recording systems. However, the durability of ME tapes, limited by a number of tribological issues, is a major concern. A preliminary investigation on durability of ME tapes in a linear tape drive has been carried out. The effect of head contour and tape tension on the durability of the head-tape interface has been studied. An optical microscopy based technique has been used to measure the quality of factory-slit tape edges and after use in a liner tape drive. Debris distribution over the head surface at the end of the testing has been monitored. The ME tapes are found to be sensitive to both head contour and tape tension. Some desirable attributes of ME tapes required to improve durability are discussed.

引用

页码：32 / 47

页数：16

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