New approach based on Double-Crossed Step-down-Stress accelerated life testing

被引：0
|
作者：
Wang Yuming [1 ]
Cai Jinyan [1 ]
Jia Zhanqiang [1 ]
机构：
[1] Ordnance Engn Coll, Shijiazhuang 050003, Peoples R China
来源：
ICEMI 2007: PROCEEDINGS OF 2007 8TH INTERNATIONAL CONFERENCE ON ELECTRONIC MEASUREMENT & INSTRUMENTS, VOL I | 2007年
关键词：
accelerated life testing; step down stress; Monte-Carlo; simulation; efficiency ratio;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
New approach based on DCSDS-ALT which is a reverse process of traditional DCSUS-ALT is introduced. Procedure of this method is given, and numeral example is shown. Conclusions are that though DCSDS-ALT is not always better than DCSUS-ALT, its effect in improving testing efficiency is obvious when some product parameter reaches to certain value. For high reliability long lifetime test, this condition usually can be satisfied, so it is applicable.
引用
收藏
页码：185 / 189
页数：5
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