Extending Electro-Optic Detection of Short Particle Beams Beyond the Transverse Phonon Resonance

被引:0
作者
Helle, Michael H. [1 ,2 ]
Gordon, Daniel F. [1 ]
Kaganovich, Dmitri [1 ]
Van Keuren, Edward [2 ]
Ting, Antonio [1 ]
机构
[1] USN, Div Plasma Phys, Res Lab, Washington, DC 20375 USA
[2] Georgetown Univ, Dept Phys, Washington, DC 20057 USA
来源
ADVANCED ACCELERATOR CONCEPTS | 2010年 / 1299卷
关键词
Ultrafast optics; relativistic particle beams; electro-optic sampling; particle beam characterization; three-wave mixing; advanced accelerator diagnostics; RADIATION;
D O I
暂无
中图分类号
O412 [相对论、场论]; O572.2 [粒子物理学];
学科分类号
摘要
A technique to noninvasively measure the longitudinal profile of an ultrashort charged particle beam is developed. This technique is based on three-wave mixing of the particle beam's self-fields and an optical probe in a nonlinear material. The resulting mixed field is then diagnosed by a cross-correlating frequency resolved optical gate, which provides both frequency and phase information about the generated pulse from which, in principle, the temporal profile can be reconstructed. An equation for the generated fields as well as numerical results showing the effects of a chirped probe pulse are presented.
引用
收藏
页码:561 / +
页数:2
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