Calibration of the Non Linear Vector Network Analyzer (PNA-X) for probe measurements

被引：0

作者：

Ouhachi, R. ^{[1
]}

Ducatteau, D. ^{[1
]}

Gaquiere, C. ^{[1
]}

Lacave, T. ^{[2
]}

Chevalier, P. ^{[2
]}

Gloria, D. ^{[2
]}

机构：

[1] Microwave Power Devices Grp, IEMN, UMR CNRS 8520, Villeneuve Dascq, France

[2] STMicroelectronics, F-38926 Crolles, France

来源：

2011 6TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE | 2011年

关键词：

NVNA; LSNA; Non Linear;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, an original calibration procedure on wafer is described for Non Linear Vector Network Analyzer. The calibration is performed using the NVNA software on frequency domain up to 50 GHz. To validate the performances, measurements will be compared with LSNA on ST microelectronics HBT SiGe.

引用

页码：81 / 84

页数：4

共 7 条

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[2]

[Anonymous], 2009, DAT U9391 CIF COMB G

[3]

[Anonymous], 2009, AGILENT PNA X SERIES

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[6]

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Van Moer, Wendy ;

Rolain, Yves .

IEEE MICROWAVE MAGAZINE, 2006, 7 (06) :46-62

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