Micro and Nano Tomography at the GKSS Imaging Beamline at PETRA III

被引:38
作者
Haibel, A. [1 ]
Ogurreck, M. [1 ]
Beckmann, F. [1 ]
Dose, T. [1 ]
Wilde, F. [1 ]
Herzen, J. [1 ]
Mueller, M. [1 ]
Schreyer, A. [1 ]
Nazmov, V. [2 ]
Simon, M. [2 ]
Last, A. [2 ]
Mohr, J. [2 ]
机构
[1] GKSS Forschungszentrum Geesthacht GmbH, Max Planck Str 1, D-21502 Geesthacht, Germany
[2] Karlsruher Inst Technol, IMT, D-76344 Eggenstein Leopoldshafen, Germany
来源
DEVELOPMENTS IN X-RAY TOMOGRAPHY VII | 2010年 / 7804卷
关键词
synchrotron tomography; micro tomography; nano tomography; PETRA III;
D O I
10.1117/12.860852
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The unique beam characteristics of PETRA III at DESY promote novel applications for many scientific fields, including imaging applications. For tomography these are techniques like high-speed and in-situ measurements marked by highest density resolutions and spatial resolutions down to the nanometer range. Furthermore, the high coherence enables phase contrast applications in an exceptional way. Therefore, the Imaging Beamline IBL is equipped with two dedicated endstations, one for micro and one for nano tomography. In addition, a very flexible X-ray and light optics concept is implemented. The micro tomography endstation is designed for samples requiring (sub-) micrometer resolution. The technical specifications of the nano tomography endstation aim for a spatial resolution of below 100 nm. The nanometer resolution will be achieved by using different combinations of compound refractive lenses as X-ray optics. The overall setup is designed to be very flexible, which allows also the implementation of other optical elements as well as the application of different magnifying techniques.
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页数:8
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