共 19 条
[1]
Alawieh Mohamed Baker, 2019, ACM IEEE DES AUT C D ACM IEEE DES AUT C D
[2]
[Anonymous], 1998, THESIS U CALIFORNIA
[3]
[Anonymous], 1996, Opt. Eng
[4]
Born M., 1999, Principle of Optics
[5]
Erdmann Andreas, 2001, P SPIE P SPIE, V4404
[6]
Flagello Donis G., 1992, P SPIE P SPIE, V1625
[7]
Investigation of machine learning for dual OPC and assist feature printing optimization
[J].
DESIGN-PROCESS-TECHNOLOGY CO-OPTIMIZATION FOR MANUFACTURABILITY XIII,
2019, 10962
[8]
Pixel-based learning method for an optimized photomask in optical lithography
[J].
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS,
2017, 16 (04)
[9]
Machine learning for mask/wafer hotspot detection and mask synthesis
[J].
PHOTOMASK TECHNOLOGY 2017,
2017, 10451
[10]
A physical resist shrinkage model for full-chip lithography simulations
[J].
ADVANCES IN PATTERNING MATERIALS AND PROCESSES XXXIII,
2016, 9779