Ion sputtered surfaces as templates for carbon nanotubes alignment and deformation

被引:13
作者
Granone, F
Mussi, V
Toma, A
Orlanducci, S
Terranova, ML
Boragno, C
de Mongeot, FB
Valbusa, U
机构
[1] Univ Genoa, Dipartimento Fis, I-16146 Genoa, Italy
[2] Univ Genoa, UDR INFM, I-16146 Genoa, Italy
[3] Univ Roma Tor Vergata, Dip Sci & Tecnol Chim, I-00133 Rome, Italy
关键词
carbon nanotubes; atomic force microscopy; nanostructured substrates;
D O I
10.1016/j.nimb.2004.12.098
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Starting from their discovery in 1991, carbon nanotubes have attracted a great attention, thanks to their peculiar mechanical, electrical and elastic properties that could be used to realize new devices in many different fields. For nanotechnology applications it is very important to be able to control not only shape and position but also alignment and orientation of carbon nanotubes, both during the growth and after it. Here we present preliminary results obtained by depositing carbon nanotubes (CNT) solutions on ion sputtered quartz substrates. Atomic force microscopy (AFM) images allow to study both CNTs positioning on the "ripples" generated by Ar+ sputtering on the SiO2 surface and their radial deformation induced by the "rough" surface. Work is now in progress to optimize the sputtering parameters and solution treatment (purification and functionalization) in order to get single CNTs regularly arranged on a patterned surface. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:545 / 550
页数:6
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