ION MASS-SPECTROMETRY;
LATENT FINGERPRINTS;
MATRIX;
IONIZATION;
RESOLUTION;
SURFACES;
FEATURES;
D O I:
10.1021/acs.analchem.7b01629
中图分类号:
O65 [分析化学];
学科分类号:
070302 ;
081704 ;
摘要:
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used in imaging of small molecules (<500 Da) in fingerprints, such as gunshot residues and illicit drugs. However, identifying and mapping relatively high mass molecules are quite difficult owing to insufficient ion yield of their molecular ions. In this report, graphene oxide (GO)-enhanced TOF-SIMS was used to detect and image relatively high mass molecules such as poison, alkaloids (>600 Da) and controlled drugs, and antibiotics (>700 Da) in fingerprints. Detail features of fingerprints such as the number and distribution of sweat pores in a ridge and even the delicate morphology of one pore were clearly revealed in SIMS images of relatively high mass molecules. The detail features combining with identified chemical composition were sufficient to establish a human identity and link the suspect to a crime scene. The wide detectable mass range and high spatial resolution make GO-enhanced TOF-SIMS a promising tool in accurate and fast analysis of fingerprints, especially in fragmental fingerprint analysis.
机构:
Stockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
SP Tech Res Inst Sweden, Dept Chem & Mat Technol, SE-50115 Boras, SwedenStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
Siljestrom, Sandra
Hode, Tomas
论文数: 0引用数: 0
h-index: 0
机构:
Portland State Univ, Dept Geol, Portland, OR 97207 USAStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
Hode, Tomas
Lausmaa, Jukka
论文数: 0引用数: 0
h-index: 0
机构:
SP Tech Res Inst Sweden, Dept Chem & Mat Technol, SE-50115 Boras, SwedenStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
Lausmaa, Jukka
Sjovall, Peter
论文数: 0引用数: 0
h-index: 0
机构:
SP Tech Res Inst Sweden, Dept Chem & Mat Technol, SE-50115 Boras, SwedenStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
Sjovall, Peter
Toporski, Jan
论文数: 0引用数: 0
h-index: 0
机构:
WITEC GmbH, Ulm, GermanyStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden
Toporski, Jan
Thiel, Volker
论文数: 0引用数: 0
h-index: 0
机构:
Univ Gottingen, Geosci Ctr, Geobiol Grp, D-37077 Gottingen, GermanyStockholm Univ, Dept Geol & Geochem, S-12066 Stockholm, Sweden