High-resolution electron time-of-flight apparatus for the soft x-ray region

被引：83
|
作者：
Hemmers, O [1 ]
Whitfield, SB
Glans, P
Wang, H
Lindle, DW
Wehlitz, R
Sellin, IA
机构：
[1] Univ Nevada, Dept Chem, Las Vegas, NV 89154 USA
[2] Univ Tennessee, Dept Phys, Knoxville, TN 37996 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 11期
关键词：
D O I：
10.1063/1.1149183
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A gas-phase time-of-flight (TOF) apparatus, capable of supporting as many as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons with kinetic energies up to 5 keV. Each analyzer includes a newly designed lens system that can retard electrons to about 2% of their initial kinetic energy without significant loss of transmission; the analyzers can thus achieve a resolving power (E/Delta/E) greater than 10(4) over a wide kinetic-energy range. Such high resolving power is comparable to the photon energy resolution of state-of-the-art synchrotron-radiation beamlines in the soft x-ray range, opening the TOF technique to numerous high-resolution applications. In addition, the angular placement of the analyzers, by design, permits detailed studies of nondipolar angular distribution effects in gas-phase photoemission. (C) 1998 American Institute of Physics. [S0034-6748(98)03611-9].
引用
收藏
页码：3809 / 3817
页数：9
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