FAST PLANE DETECTION IN DISPARITY MAPS

被引:5
作者
Bughin, E. [1 ]
Almansa, A. [2 ]
von Gioi, R. Grompone [1 ]
Tendero, Y. [1 ]
机构
[1] CMLA ENS Cachan, 61 Ave President Wilson, F-94235 Cachan, France
[2] ENST TSI, F-75634 Paris, France
来源
2010 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING | 2010年
关键词
D O I
10.1109/ICIP.2010.5653440
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose a new method for fast detection of planar patches in disparity maps. We first use a region growing algorithm on random seeds. This approach is similar to the one introduced in [1] for fast line segment detection in images. Then, the parameter-free criterion introduced in [2] is used to keep only the patches that are planar. The main advantage of our method is to be able to estimate the disparity map precision which is usually a critical parameter in other methods. This method is specially well suited to 3D reconstruction of urban environments from low-baseline aerial or satellite stereo pairs where a piecewise-planar model can be applied.
引用
收藏
页码:2961 / 2964
页数:4
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