Reversal of the magnetoelectric effect at a ferromagnetic metal/ferroelectric interface induced by metal oxidation

被引:16
作者
Chen, Zhaojin [1 ]
Yang, Qiong [1 ]
Tao, Lingling [2 ]
Tsymbal, Evgeny Y. [2 ]
机构
[1] Xiangtan Univ, Sch Mat Sci & Engn, Xiangtan 411105, Hunan, Peoples R China
[2] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
POLARIZATION; STATES;
D O I
10.1038/s41524-021-00679-2
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Multiferroic materials composed of ferromagnetic and ferroelectric components are interesting for technological applications due to sizable magnetoelectric coupling allowing the control of magnetic properties by electric fields. Due to being compatible with the silicon-based technology, HfO2-based ferroelectrics could serve as a promising component in the composite multiferroics. Recently, a strong charge-mediated magnetoelectric coupling has been predicted for a Ni/HfO2 multiferroic heterostructure. Here, using density functional theory calculations, we systematically study the effects of the interfacial oxygen stoichiometry relevant to experiments on the magnetoelectric effect at the Ni/HfO2 interface. We demonstrate that the magnetoelectric effect is very sensitive to the interface stoichiometry and is reversed if an oxidized Ni monolayer is formed at the interface. The reversal of the magnetoelectric effect is driven by a strong Ni-O bonding producing exchange-split polarization-sensitive antibonding states at the Fermi energy. We argue that the predicted reversal of the magnetoelectric effect is typical for other 3d ferromagnetic metals, such as Co and Fe, where the metal-oxide antibonding states have an opposite spin polarization compared to that in the pristine ferromagnetic metals. Our results provide an important insight into the mechanism of the interfacial magnetoelectric coupling, which is essential for the physics and application of multiferroic heterostructures.
引用
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页数:7
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共 67 条
  • [1] A Complementary Metal Oxide Semiconductor Process-Compatible Ferroelectric Tunnel Junction
    Ambriz-Vargas, Fabian
    Kolhatkar, Gitanjali
    Broyer, Maxime
    Hadj-Youssef, Azza
    Nouar, Rafik
    Sarkissian, Andranik
    Thomas, Reji
    Gomez-Yanez, Carlos
    Gauthier, Marc A.
    Ruediger, Andreas
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (15) : 13262 - 13268
  • [2] Bauer U, 2015, NAT MATER, V14, P174, DOI [10.1038/NMAT4134, 10.1038/nmat4134]
  • [3] Positive spin polarization in Co/Al2O3/Co tunnel junctions driven by oxygen adsorption -: art. no. 224422
    Belashchenko, KD
    Tsymbal, EY
    Oleynik, II
    van Schilfgaarde, M
    [J]. PHYSICAL REVIEW B, 2005, 71 (22):
  • [4] Effect of interface bonding on spin-dependent tunneling from the oxidized Co surface
    Belashchenko, KD
    Tsymbal, EY
    van Schilfgaarde, M
    Stewart, DA
    Oleynik, II
    Jaswal, SS
    [J]. PHYSICAL REVIEW B, 2004, 69 (17): : 174408 - 1
  • [5] Reversible Control of Co Magnetism by Voltage-Induced Oxidation
    Bi, Chong
    Liu, Yaohua
    Newhouse-Illige, T.
    Xu, M.
    Rosales, M.
    Freeland, J. W.
    Mryasov, Oleg
    Zhang, Shufeng
    te Velthuis, S. G. E.
    Wang, W. G.
    [J]. PHYSICAL REVIEW LETTERS, 2014, 113 (26)
  • [6] Multiferroics:: Towards a magnetoelectric memory
    Bibes, Manuel
    Barthelemy, Agnes
    [J]. NATURE MATERIALS, 2008, 7 (06) : 425 - 426
  • [7] Polarization-dependent magnetism of the Ni/BaTiO3 interface
    Bocirnea, A. E.
    Popescu, D. G.
    Chirila, C.
    Costescu, R. M.
    Kuncser, V
    Stancu, V
    Trupina, L.
    Pasuk, I
    Vlaicu, A. M.
    Husanu, M. A.
    [J]. PHYSICAL REVIEW MATERIALS, 2020, 4 (03):
  • [8] Ferroelectricity in hafnium oxide thin films
    Boescke, T. S.
    Mueller, J.
    Braeuhaus, D.
    Schroeder, U.
    Boettger, U.
    [J]. APPLIED PHYSICS LETTERS, 2011, 99 (10)
  • [9] Cao W, 2020, NAT COMMUN, V11, DOI 10.1038/s41467-019-13797-9
  • [10] Ultra-low power Hf0.5Zr0.5O2 based ferroelectric tunnel junction synapses for hardware neural network applications
    Chen, Lin
    Wang, Tian-Yu
    Dai, Ya-Wei
    Cha, Ming-Yang
    Zhu, Hao
    Sun, Qing-Qing
    Ding, Shi-Jin
    Zhou, Peng
    Chua, Leon
    Zhang, David Wei
    [J]. NANOSCALE, 2018, 10 (33) : 15826 - 15833