Measurement of nanosize etched pits in SiO2 optical fiber conduit using AFM

Fission fragment tracks from Cf-252 have been observed in SiO2 optical fiber, using an atomic force microscope (AFM), after a very short chemical etching in hydrofluoric acid solution at normal temperature. The nuclear track starting and evolution process is followed by the AFM direct measurements on the material surface and beyond a fine layer of the surface material. The images of the scanned cones were determined observing the two predominant energies from Cf-252 fission fragments and the development of the tracks in the 150 mum diameter optical fiber conduit. (C) 2003 Elsevier Ltd. All rights reserved.