Study of generalized magneto-optical ellipsometry measurement reliability

被引：22

作者：

Arregi, J. A. ^{[1
]}

Gonzalez-Diaz, J. B. ^{[1
]}

Bergaretxe, E. ^{[1
]}

Idigoras, O. ^{[1
]}

Unsal, T. ^{[1
]}

Berger, A. ^{[1
]}

机构：

[1] CIC NanoGUNE Consolider, E-20018 Donostia San Sebastian, Spain

来源：

JOURNAL OF APPLIED PHYSICS | 2012年 / 111卷 / 10期

关键词：

REVERSAL; VECTOR;

D O I：

10.1063/1.4720471

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present an experimental and theoretical study of the reliability of generalized magneto-optical ellipsometry measurements, investigate its dependence from data set acquisition geometries, as well as investigate the underlying physics of light reflection for magneto-optical materials to explain the observed behavior. Specifically, we compare the use of two different grids of data points and evaluate their reliability and repeatability in a comparative study. We find that the conventionally used square grid is actually not ideal for generalized magneto-optical ellipsometry (GME) measurements and that the also investigated diagonal lattice is clearly superior. These experimental results were reproduced in theoretical calculations of the detection process. The physical origin of this behavior was identified to be related to the "quality" of the individual data points that are included in the data analysis process, with the highest quality data being achieved near the crossed polarizer line, i.e., the region that is more prominently utilized in the diagonal grid approach presented here. These results will help to improve the precision and the data acquisition time of GME measurements. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4720471)

引用

页数：8

共 20 条

[1] Magneto-optical study of the spin-polarized electronic states in multiferroic TbMnO3 [J].

Bastjan, M. ;

Singer, S. G. ;

Neuber, G. ;

Eller, S. ;

Aliouane, N. ;

Argyriou, D. N. ;

Cooper, S. L. ;

Rubhausen, M. .

PHYSICAL REVIEW B, 2008, 77 (19)

[2] Quantitative vector magnetometry using generalized magneto-optical ellipsometry [J].

Berger, A ;

Pufall, MR .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) :4583-4585

[3] Generalized magneto-optical ellipsometry [J].

Berger, A ;

Pufall, MR .

APPLIED PHYSICS LETTERS, 1997, 71 (07) :965-967

[4] Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation [J].

Hofmann, T. ;

Schade, U. ;

Herzinger, C. M. ;

Esquinazi, P. ;

Schubert, M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (06)

[5] Collapse of hard-axis behavior in uniaxial Co films [J].

Idigoras, O. ;

Suszka, A. K. ;

Vavassori, P. ;

Landeros, P. ;

Porro, J. M. ;

Berger, A. .

PHYSICAL REVIEW B, 2011, 84 (13)

[6] Kerr microscopy study of magnetization reversal in uniaxial Co-films [J].

Idigoras, O. ;

Vavassori, P. ;

Porro, J. M. ;

Berger, A. .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2010, 322 (20) :L57-L60

[7] AN IMPROVED METHOD FOR HIGH REFLECTIVITY ELLIPSOMETRY BASED ON A NEW POLARIZATION MODULATION TECHNIQUE [J].

JASPERSON, SN ;

SCHNATTERLY, SE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :761-+

[8] CALIBRATION OF POLAR KERR ROTATION AND ELLIPTICITY MEASUREMENTS [J].

KIM, WS ;

ADERHOLZ, M ;

KLEEMANN, W .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1993, 4 (11) :1275-1280

[9] Magneto-optical coupling in ferromagnetic thin films investigated by vector-magneto-optical generalized ellipsometry [J].

Mok, K. ;

Kovacs, G. J. ;

McCord, J. ;

Li, L. ;

Helm, M. ;

Schmidt, H. .

PHYSICAL REVIEW B, 2011, 84 (09)

[10] Vector-magneto-optical generalized ellipsometry [J].

Mok, K. ;

Du, N. ;

Schmidt, H. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2011, 82 (03)

← 1 2 →