Polarity inversion in polar-nonpolar-polar heterostructures

被引:5
作者
Cho, SL [1 ]
Youn, SJ
Kim, Y
DiVenere, A
Wong, GKL
Freeman, AJ
Ketterson, JB
机构
[1] Univ Ulsan, Dept Phys, Ulsan 680749, South Korea
[2] Northwestern Univ, Dept Phys & Astron, Evanston, IL 60208 USA
[3] HKUST, Dept Phys, Kowloon, Hong Kong, Peoples R China
[4] Northwestern Univ, Dept Elect & Comp Engn, Evanston, IL 60208 USA
关键词
D O I
10.1103/PhysRevLett.87.126403
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have observed an epilayer-thickness-dependent polarity inversion for the growth of CdTe on Sb(Bi)/CdTe(111)B. For films with Sb(Bi) thicknesses of less than 40 Angstrom (15 Angstrom), the CdTe layer shows a B (Te-terminated) face, but it switches to an A (Cd-terminated) face for thicker layers. On the other hand, a CdTe layer grown on Bi(Sb)/Me(111)A always shows the A face regardless of Sb or Bi layer thicknesses. In order to address the observations we have performed ab initio calculations, which suggest that the polarity of a polar material on a nonpolar one results from the binding energy difference between the two possible surface configurations.
引用
收藏
页码:126403 / 126403
页数:4
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