TEM observation of tin whisker

被引：5

作者：

Liu Meng ^{[1
]}

Xian AiPing ^{[1
]}

机构：

[1] Chinese Acad Sci, Shenyang Natl Lab Mat Sci, Inst Met Res, Shenyang 110016, Peoples R China

来源：

SCIENCE CHINA-TECHNOLOGICAL SCIENCES | 2011年 / 54卷 / 06期

基金：

中国国家自然科学基金;

关键词：

tin; whiskers; transmission electron microscope; GROWTH;

D O I：

10.1007/s11431-011-4381-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The tin whiskers spontaneously grew from the NdSn3 intermetallic compound (IMC) after exposure to ambient conditions. One such fine tin whisker with a diameter of about 600 nm was observed by transmission electron microscope (TEM). The results showed the whisker was a perfect beta-Sn single-crystal without dislocations or low angle grain boundaries. The whisker growth axis was calculated as [111]. There were interference fringes in the bright-field image of the tin whisker, which reflected the existence of growth stress in the whisker. A 15-18 nm native tin-oxide film on the tin whisker containing many crystal defects was also found. The new results are helpful in understanding the tin whisker growth mechanism.

引用

页码：1546 / 1550

页数：5