Crystal rotation in Cu single crystal micropillars:: In situ Laue and electron backscatter diffraction

被引：76

作者：

Maass, R. ^{[1
]}

Van Petegem, S. ^{[1
]}

Grolimund, D. ^{[1
]}

Van Swygenhoven, H. ^{[1
]}

Kiener, D. ^{[2
,3
]}

Dehm, G. ^{[2
,3
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Austrian Acad Sci, Erich Schmid Inst Mat Sci, A-8700 Leoben, Austria

[3] Montan Univ Leoben, Dept Mat Phys, A-8700 Leoben, Austria

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 07期

关键词：

D O I：

10.1063/1.2884688

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In situ microdiffraction experiments were conducted on focused ion beam machined single crystal Cu pillars oriented for double slip. During deformation, the crystal undergoes lattice rotation on both the primary and critical slip system. In spite of the initial homogeneous microstructure of the Cu pillar, rotation sets in already at yield and is more important at the top of the pillar than at the bottom, demonstrating the inhomogeneous stress state during a microcompression experiment. The rotation results are confirmed by electron backscatter diffraction measurements. (C) 2008 American Institute of Physics.

引用

页数：3

共 15 条

[1] Quantitative microdiffraction from deformed crystals with unpaired dislocations and dislocation walls [J].