THICKNESS UNIFORMITY INSPECTION WITH COMPARISON OFF-AXIS DIGITAL HOLOGRAPHY

被引：0
作者：
Jin, Jinan [1 ]
Jeon, Sungbin [1 ]
Cho, Janghyun [2 ]
Park, No-Cheol [1 ]
机构：
[1] Yonsei Univ, Dept Mech Engn, 50 Yonsei Ro, Seoul, South Korea
[2] Yonsei Univ, Ctr Informat Storage Device, 50 Yonsei Ro, Seoul, South Korea
来源：
PROCEEDINGS OF THE ASME CONFERENCE ON INFORMATION STORAGE AND PROCESSING SYSTEMS, 2016 | 2016年
关键词：
MICROSCOPY;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
This research proposes a comparison off-axis digital holographic technology for thickness uniformity inspection of transparent products. Compared to existing technologies, the comparison off-axis digital holographic method has advantages such as high depth resolution and large field of view. Also, the proposed method can measure the thickness differences between standard product and the ones produced by one shot imaging with tilt correction. Comparative analysis is used to demonstrate the effectiveness.
引用
收藏
页数：3
相关论文
共 50 条
  • [41] Multiplexed off-axis holography using a transmission diffraction grating
    Lu, Yujie
    Liu, Yunhui
    Li, Peng
    Fu, Yili
    Zhao, Jie
    [J]. OPTICS LETTERS, 2016, 41 (03) : 512 - 515
  • [42] Transfer and reconstruction of the density matrix in off-axis electron holography
    Roeder, Falk
    Lubk, Axel
    [J]. ULTRAMICROSCOPY, 2014, 146 : 103 - 116
  • [43] Performance of a direct detection camera for off-axis electron holography
    Chang, Shery L. Y.
    Dwyer, Christian
    Barthel, Juri
    Boothroyd, Chris B.
    Dunin-Borkowski, Rafal E.
    [J]. ULTRAMICROSCOPY, 2016, 161 : 90 - 97
  • [44] In situ biasing and off-axis electron holography of a ZnO nanowire
    den Hertog, Martien
    Donatini, Fabrice
    McLeod, Robert
    Monroy, Eva
    Sartel, Corinne
    Sallet, Vincent
    Pernot, Julien
    [J]. NANOTECHNOLOGY, 2018, 29 (02)
  • [45] Dual-wavelength off-axis digital holography using a single light-emitting diode
    Cho, Janghyun
    Lim, Jinsang
    Jeon, Sungbin
    Choi, Guk-Jong
    Moon, Hyungbae
    Park, No-Cheol
    Park, Young-Pil
    [J]. OPTICS EXPRESS, 2018, 26 (02): : 2123 - 2131
  • [46] Automatic filtering for zero-order and twin-image elimination in off-axis digital holography
    Dong, Zhao
    Wang, Huaying
    Wang, Xue
    [J]. OPTICAL ENGINEERING, 2019, 58 (02)
  • [47] Accurate extraction of the+1 term spectrum with spurious spectrum elimination in off-axis digital holography
    Zhang, Jifan
    Huang, Liu
    Chen, Benyong
    Yan, Liping
    [J]. OPTICS EXPRESS, 2022, 30 (15) : 28142 - 28157
  • [48] Dual-plane slightly off-axis digital holography based on a single cube beam splitter
    Leon-Rodriguez, Miguel
    Rayas, Juan A.
    Cordero, Raul R.
    Martinez-Garcia, Amalia
    Martinez-Gonzalez, Adrian
    Tellez-Quinones, Alejandro
    Yanez-Contreras, Pedro
    Medina-Cazares, Orlando
    [J]. APPLIED OPTICS, 2018, 57 (10) : 2727 - 2735
  • [49] Accurate solution of oblique reference wave for tilt phase aberration correction in digital off-axis holography
    Li, Fang
    Wang, Ming-qing
    Zheng, Ming
    Lu, Wei
    Yu, Qing-nan
    Jia, Yan
    Wu, Jian
    [J]. AOPC 2017: OPTICAL SENSING AND IMAGING TECHNOLOGY AND APPLICATIONS, 2017, 10462
  • [50] Improved phase retrieval method with dual-plane holograms for slightly off-axis digital holography
    Deng, Dingnan
    Liao, Meihua
    Cai, Zewei
    [J]. OPTICS COMMUNICATIONS, 2024, 569
12345