High-resolution CdTe detector and applications to imaging devices

被引:90
|
作者
Takahashi, T [1 ]
Watanabe, S
Kouda, M
Sato, G
Okada, Y
Kubo, S
Kuroda, Y
Onishi, M
Ohno, R
机构
[1] Inst Space & Astronaut Sci, Sagamihara, Kanagawa 2298510, Japan
[2] Univ Tokyo, Dept Phys, Bunkyo Ku, Tokyo 1130033, Japan
[3] Clear Pulse Co Ltd, Chuo Ku, Ohta, Tokyo 1430024, Japan
[4] Mitsubishi Heavy Ind Co Ltd, Nagoya Guidance & Prop Syst Works, Aichi 4858561, Japan
[5] Daiichi Syst Engn Co Ltd, Aichi 4858561, Japan
[6] ACRORAD, Okinawa 9042234, Japan
关键词
CdTe; CdZnTe; pixel detector;
D O I
10.1109/23.940067
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using a high quality Cadmium Telluride (CdTe) wafer, we formed a Schottky junction and operated the detector as a diode (CdTe diode). The low leakage current of the CdTe diode allows us to apply a much higher bias voltage than was possible with the previous CdTe detectors. For a relatively thin detector of similar to 0.5 mm thick, the high bias voltage results in a high electric field in the device. Both the improved charge collection efficiency and the low-leakage current lead to an energy resolution of 1.1 keV FWHM at 60 keV for a 2 x 2 mm(2) device and 2 keV for a 10 x 10 mm(2) device at 5 degreesC without any charge-loss correction electronics. For astrophysical applications, we have developed an initial prototype CdTe pixel detector based on the CdTe diode. The detector has 400 pixels with a pixel size of 625 x 625 mum(2). Each pixel is gold-stud bonded to a fanout board and routed to a front end ASIC to measure pulse height information for each gamma -ray photon.
引用
收藏
页码:287 / 291
页数:5
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