Invasiveness of an optical magnetic field probe

被引:2
|
作者
Arakawa, S [1 ]
Suzuki, E
Ota, H
Arai, K
Sato, R
机构
[1] Anritsu Corp, Atsugi, Kanagawa 2438555, Japan
[2] TDK Corp, Ichikawa 2728558, Japan
[3] NICT, Sendai EMC Res Ctr, Sendai, Miyagi 9893204, Japan
关键词
magnetic near-field measurement; probe; loop antenna; electro-optical effect; invasiveness; finite difference time domain (FDTD) method;
D O I
10.1093/ietcom/e88-b.8.3170
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electromagnetic field probes inevitably disturb the original distribution of the field when they are positioned close to a device. This disturbance in turn affects measurement accuracy and device operation. We developed an optical magnetic field probe, comprising a loop antenna element and an electro-optic crystal, for highly accurate magnetic near-field measurement in the GHz frequency range. We analyzed the invasiveness of the optical magnetic field probe quantitatively both experimentally and using finite difference time domain simulation. We found that eliminating the metal cable reduced the disturbance of the surrounding field that was to be measured. In addition, we investigated the magnetic field detection characteristics of the probe and its influence on the operation of a microstrip line. The optical magnetic field probe was less invasive and provided more accurate measurement.
引用
收藏
页码:3170 / 3175
页数:6
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