Data Acquisition and Virtual Instrumentation System for the Study of Peltier and Seebeck Effects

被引：1

作者：

Sandu, Florin ^{[1
]}

Sandu, Venetia ^{[1
]}

Nan, Stefan ^{[1
]}

Dumitru, Adrian Iulian ^{[1
]}

机构：

[1] Transilvania Univ Brasov, Brasov, Romania

来源：

OPTIM 2010: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, PTS I-IV | 2010年

关键词：

D O I：

10.1109/OPTIM.2010.5510513

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper presents the development of a data acquisition system dedicated to the study of Peltier and Seebeck effect and to the performance parameters of a commercial thermoelectric semiconductor element. It was used a National Instruments NI USB-6008 Data Acquisition System (connected to National Semiconductor LM35 temperature sensors) to build a Virtual Instrumentation system programmed in NI LabView. There are presented computational models and experimental data interpretations.

引用

页码：903 / 908

页数：6

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