Data Acquisition and Virtual Instrumentation System for the Study of Peltier and Seebeck Effects

被引：1
|
作者：
Sandu, Florin [1 ]
Sandu, Venetia [1 ]
Nan, Stefan [1 ]
Dumitru, Adrian Iulian [1 ]
机构：
[1] Transilvania Univ Brasov, Brasov, Romania
来源：
OPTIM 2010: PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, PTS I-IV | 2010年
关键词：
D O I：
10.1109/OPTIM.2010.5510513
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents the development of a data acquisition system dedicated to the study of Peltier and Seebeck effect and to the performance parameters of a commercial thermoelectric semiconductor element. It was used a National Instruments NI USB-6008 Data Acquisition System (connected to National Semiconductor LM35 temperature sensors) to build a Virtual Instrumentation system programmed in NI LabView. There are presented computational models and experimental data interpretations.
引用
收藏
页码：903 / 908
页数：6
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