共 10 条
- [1] STRUCTURAL MODEL FOR THE NEGATIVE ELECTRON-AFFINITY SURFACE OF O/CS/SI(001)2X1 [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (02): : L303 - L305
- [2] ELECTRONIC-STRUCTURE OF THE SINGLE-DOMAIN SI(001) 2 X 1-K SURFACE [J]. PHYSICAL REVIEW B, 1989, 39 (08): : 5524 - 5526
- [4] PREFERENTIAL DIFFUSION OF VACANCIES PERPENDICULAR TO THE DIMERS ON SI(001)2 X 1 SURFACES STUDIED BY UHV REM [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (06): : L1042 - L1044
- [5] REM OBSERVATION ON CONVERSION BETWEEN SINGLE-DOMAIN SURFACES OF SI(001) 2X1 AND 1X2 INDUCED BY SPECIMEN HEATING CURRENT [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (05): : L858 - L861
- [6] LATYSHEV AV, 1988, JETP LETT+, V48, P526
- [9] ELECTROMIGRATION INDUCED STEP BUNCHING ON SI SURFACES - HOW DOES IT DEPEND ON THE TEMPERATURE AND HEATING CURRENT DIRECTION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (01): : 1 - 6
- [10] SCANNING TUNNELING MICROSCOPY OF CLEAN SILICON SURFACES AT ELEVATED-TEMPERATURES [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1993, 32 (3B): : 1368 - 1378