Diffusion of small self-interstitial clusters in silicon: Temperature-accelerated tight-binding molecular dynamics simulations

被引:25
作者
Cogoni, M
Uberuaga, BP
Voter, AF
Colombo, L
机构
[1] Univ Cagliari, Sardinian Lab Computat Mat Sci, INFM, SLACS, I-09042 Monserrato, CA, Italy
[2] Univ Cagliari, Dipartimento Fis, I-09042 Monserrato, CA, Italy
[3] Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA
[4] Los Alamos Natl Lab, Div Theoret, Los Alamos, NM 87545 USA
关键词
D O I
10.1103/PhysRevB.71.121203
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature-accelerated tight-binding molecular dynamics simulations show that self-interstitial clusters formed from two and three defects are mobile species. In particular, the di-interstitial (I-2) cluster is found to diffuse nearly as fast as the single self-interstitial (dumbbell) over a wide temperature range. In particular, at room temperature I-2 is found to diffuse at a rate similar to the dumbbell, thus making an important contribution to silicon self-diffusion at temperatures relevant for silicon bulk processing. The simulations also reveal the atomistic mechanisms responsible for the defects' mobility, showing that the I-2 cluster must be promoted to a metastable state in which it executes several diffusive events before decaying to a new ground-state configuration equivalent to the initial one.
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页数:4
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