Thin-Film-Flip-Chip LEDs Grown on Si Substrate Using Wafer-Level Chip-Scale Package

被引:11
作者
Lee, Keon Hwa [1 ,2 ]
Asadirad, Mojtaba [3 ]
Shervin, Shahab [3 ]
Oh, Seung Kyu [2 ,4 ]
Oh, Jeong Tak [1 ]
Song, June-O [1 ]
Moon, Yong-Tae [1 ]
Ryou, Jae-Hyun [5 ]
机构
[1] LG Innotek Co Ltd, Dept LED Business, Paju 413901, South Korea
[2] Univ Houston, Dept Mech Engn, Houston, TX 77204 USA
[3] Univ Houston, Mat Sci & Engn Program, Houston, TX 77204 USA
[4] Sunchon Natl Univ, Dept Printed Elect Engn, Sunchon 540742, South Korea
[5] Univ Houston, Texas Ctr Superconduct, Mat Sci & Engn Program, Dept Mech Engn, Houston, TX 77204 USA
关键词
Anisotropic conductive film (ACF); thin film flip chip (TFFC); wafer-level chip-scale package (WLCSP); curvature-control region; gallium-nitride-on-silicon (GaN-on-Si); LIGHT-EMITTING-DIODES; GAN;
D O I
10.1109/LPT.2016.2580039
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Demonstrated are visible GaN-based light-emitting diodes (LEDs) on economical large-area Si substrates using an advanced device and packaging architecture to improve optical output power, while reducing manufacturing costs. The process employs thin-film-flip-chip devices and wafer-level chip-scale packages and uses through-Si-via substrate and anisotropic conductive film for bonding. The improved curvature control region is applied in the epitaxial growth of the LED structure on a Si substrate to achieve flat wafers for epitaxial structures at room temperature, which is critical for wafer-level bonding. External quantum efficiency and light-output power at 350 mA increase by similar to 12% compared with those of conventional flip-chip LEDs grown on a sapphire substrate. The devices also show a reverse-bias leakage current failure rate of <10%.
引用
收藏
页码:1956 / 1959
页数:4
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