Structure of Ga-stabilized GaAs(001) surfaces at high temperatures

被引:5
作者
Ohtake, A [1 ]
Tsukamoto, S [1 ]
Pristovsek, M [1 ]
Koguchi, N [1 ]
机构
[1] NIMS, Tsukuba, Ibaraki 3050047, Japan
关键词
Gallium arsenide; reflection high-energy electron diffraction; surface reconstruction;
D O I
10.1016/S0169-4332(03)00039-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have studied the atomic structure of the Ga-stabilized GaAs(001)-c(8 x 2) surface using rocking-curve analysis of reflection high-energy electron diffraction (RHEED). The c(8 x 2) surface is stable only at temperatures higher than 600 degreesC, but changes to the (2 x 6)/(3 x 6) structure at lower temperatures. The atomic structure of the c(8 x 2) surface at high temperatures is basically the same as that determined by the analysis at room temperature. We propose that the surface atomic configurations are locally fluctuating at high temperatures. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:146 / 150
页数:5
相关论文
共 19 条
[1]   STRUCTURE OF GAAS(100)-C(8X2)-GA [J].
CERDA, J ;
PALOMARES, FJ ;
SORIA, F .
PHYSICAL REVIEW LETTERS, 1995, 75 (04) :665-668
[2]   RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS [J].
DOYLE, PA ;
TURNER, PS .
ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 :390-&
[3]   ROCKING-CURVE ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION FROM THE SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-AL, SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-GA, AND SI(111)-(ROOT-3X-ROOT-3)R30-DEGREES-IN SURFACE [J].
HANADA, T ;
DAIMON, H ;
INO, S .
PHYSICAL REVIEW B, 1995, 51 (19) :13320-13325
[4]   STUDY OF THE SI(111)7X7 SURFACE BY RHEED ROCKING CURVE ANALYSIS [J].
HANADA, T ;
INO, S ;
DAIMON, H .
SURFACE SCIENCE, 1994, 313 (1-2) :143-154
[5]   CORRECTION [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (10) :1365-1365
[6]   MANY-BEAM CALCULATION OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION (RHEED) INTENSITIES BY THE MULTI-SLICE METHOD [J].
ICHIMIYA, A .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (01) :176-180
[7]   Atomic structure of the InSb(001)-C(8x2) reconstruction determined by X-ray diffraction [J].
Jones, N ;
Norris, C ;
Nicklin, CL ;
Steadman, P ;
Baker, SH ;
Johnson, AD ;
Bennett, SL .
SURFACE SCIENCE, 1998, 409 (01) :27-36
[8]   DETERMINATION OF THE SI(111) 1X1 STRUCTURE AT HIGH-TEMPERATURE BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION [J].
KOHMOTO, S ;
ICHIMIYA, A .
SURFACE SCIENCE, 1989, 223 (03) :400-412
[9]   MICROSCOPIC STRUCTURE OF THE GAAS(001)-(6X6) SURFACE DERIVED FROM SCANNING-TUNNELING-MICROSCOPY [J].
KUBALL, M ;
WANG, DT ;
ESSER, N ;
CARDONA, M ;
ZEGENHAGEN, J ;
FIMLAND, BO .
PHYSICAL REVIEW B, 1995, 51 (19) :13880-13882
[10]   Structure of metal-rich (001) surfaces of III-V compound semiconductors [J].
Kumpf, C ;
Smilgies, D ;
Landemark, E ;
Nielsen, M ;
Feidenhans'l, R ;
Bunk, O ;
Zeysing, JH ;
Su, Y ;
Johnson, RL ;
Cao, L ;
Zegenhagen, J ;
Fimland, BO ;
Marks, LD ;
Ellis, D .
PHYSICAL REVIEW B, 2001, 64 (07)